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Electron microscopy
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#	Item
771	PROFESSOR DR ULF KLEINEBERG Shaping the future of electronics Professor Dr Ulf Kleineberg describes his research into effecting changes to the characteristics of nanoscale materials through light pulsed at attosecond in Add to Reading List Source URL: www.munich-photonics.de Language: English - Date: 2014-02-03 09:52:06 Nonlinear optics Orders of magnitude Photonics Ferenc Krausz Photoemission electron microscopy Attosecond Attophysics Ultrashort pulse Mode-locking Physics Optics Laser science
772	Munich Munich-Centre for Advanced Photonics Our group is part of the research framework of the Laboratory for Attosecond Physics (LAP) and the Cluster of Excellence “Munich-Centre “Munich Add to Reading List Source URL: www.munich-photonics.de Language: English - Date: 2015-01-14 08:38:37 Attosecond Attophysics Laser Optoelectronics Ferenc Krausz Physics Microscopes Photoemission electron microscopy
773	PAUL SCHERRER INSTITUT Technology Transfer R&D Services Add to Reading List Source URL: www.psi.ch Language: English - Date: 2014-11-28 07:19:08 Microscopy Microscope Electron microscope Scanning electron microscope Magnetic force microscope Optical microscope Scanning tunneling microscope Characterization Vibrational analysis with scanning probe microscopy Scientific method Scanning probe microscopy Science
774	PAUL SCHERRER INSTITUT Technology Transfer R&D Services Add to Reading List Source URL: www.psi.ch Language: English - Date: 2014-11-28 07:19:09 Nuclear reprocessing Electron microscopy Actinides Nuclear chemistry Nuclear technology Nuclear fuel Ionizing radiation Transmission electron microscopy X-ray Nuclear physics Physics Chemistry
775	Invited Paper Trends in synchrotron-based tomographic imaging: the SLS experience M. Stampanoni, A. Groso, A. Isenegger, G. Mikuljan, Q. Chen, A. Bertrand, S. Henein, R. Betemps, U. Frommherz, P. B¨ohler, D. Meister, M Add to Reading List Source URL: www.psi.ch Language: English - Date: 2015-02-02 10:57:55 Imaging Medical imaging Microscopy Microscopes Electron microscopy Phase-contrast imaging X-ray microscope Phase contrast microscopy Monochromator Optics Scientific method Science
776	To appear in the IEEE/ASME Advanced Mechatronics Conference, Kobe, Japan, July[removed]High Aspect Ratio Polymer Micro/Nano-Structure Manufacturing using Nanoembossing, Nanomolding and Directed Self-Assembly Metin Sitti Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:37 Materials science Microtechnology Intermolecular forces Emerging technologies Ion track Polymer Atomic force microscopy Electron microscope Metin Sitti Nanotechnology Science Scientific method
777	Plasma-FIB (Focused Ion Beam) The C2MI plasma-FIB is mainly used to perform micro crosssections on samples by using an ion source. The ion source is focused on the sample to obtain a small beam that can etch the surface Add to Reading List Source URL: www.c2mi.ca Language: English - Date: 2014-11-24 15:51:29 Semiconductor device fabrication Electron microscopy Thin film deposition Ions Focused ion beam Ion beam Ion source Fib Scanning electron microscope Chemistry Scientific method Physics
778	Integrated Correlative Microscopy – FEI iCorr Add to Reading List Source URL: www.charfac.umn.edu Language: English - Date: 2014-11-19 17:07:19 Electron microscopy Microscopy Microscopes Fluorescence Fluorescent dyes Electron microscope Transmission electron microscopy Fluorescence microscope Immunogold labelling Chemistry Scientific method Biology
779	IEEE/ASME TRANSACTIONS ON MECHATRONICS, VOL. 5, NO. 2, JUNE[removed]Controlled Pushing of Nanoparticles: Modeling and Experiments Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:36 Nanotechnology Intermolecular forces Atomic force microscopy Nanoparticle Electron Magnetic force microscope Local oxidation nanolithography Scanning probe microscopy Physics Science
780	Two-Dimensional Vision-Based Autonomous Microparticle Manipulation using a Nanoprobe Chytra Pawashe and Metin Sitti Nanorobotics Laboratory Scaife Hall 305 Department of Mechanical Engineering Add to Reading List Source URL: nanolab.me.cmu.edu Language: English - Date: 2012-11-16 19:15:37 Microscopy Materials science Scanning probe microscopy Atomic force microscopy Optical microscope Microscope Optical fiber AFM probe Electron microscope Nanotechnology Science Scientific method

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